Ключевые слова: MgB2, thin films, carbon, ion irradiation, irradiation effects, X-ray diffraction, critical caracteristics, upper critical fields, heat treatment, annealing process, substrate single crystal, HPCVD process, resistive transition, magnetization, critical temperature, lattice parameter, Jc/B curves, experimental results
Ferdeghini C., Braccini V., Putti M., Ghigo G., Gozzelino L., Pallecchi I., Pace S., Grimaldi G., Leo A., Nigro A., Martinelli A., Bellingeri E., Torsello D., Sylva G., Pellegrino L.
Porokhov N.V., Chukharkin M.L., Maresov A.G., Snigirev O.V., Levin E.E., Kalaboukhov A.S., Zenova E.V.
Ключевые слова: HTS, YBCO, thin films, PLD process, substrate single crystal, buffer layers, magnetron sputtering, X-ray diffraction, phase composition, microstructure, current-voltage characteristics, temperature dependence, resistive transition, magnetic field dependence, activation energies, critical caracteristics, critical current, flux flow, upper critical fields, experimental results
Kudriashov A.V., Klyachkin L.E., Malyarenko A.M., Nashchekin A.V., Romanov V.V., Rykov S.A., Bagraev N.T.
Li M., Xi X.X., Hellstrom E., Davidson B.A., Chen K., Acharya N., Collantes Y., Kasaei L., Manichev V., Feldman L.C., Gustafsson T., Demir M., Bhattarai P.
Ключевые слова: HTS, YBCO, thin films, fabrication, substrate single crystal, buffer layers, PLD process, defects columnar, ion irradiation, irradiation effects, pinning, critical caracteristics, anisotropy, Jc/B curves, X-ray diffraction, microstructure, critical current density, angular dependence, n-value, experimental results
Ключевые слова: HTS, YBCO, films, substrate single crystal, insulation, insulating factor, experimental results
Ключевые слова: YBCO, PrBCO, X-ray diffraction, precursors, solid-state synthesis, bulk, PLD process, multilayered structures, films epitaxial, buffer layers, nanoscaled effects, substrate LaAlO3, substrate single crystal, resistive transition, resistivity, temperature dependence, thickness dependence, fabrication, experimental results
Ключевые слова: HTS, YBCO, films epitaxial, substrate single crystal, chemical solution deposition, buffer layers, gradient, X-ray diffraction, temperature dependence, fabrication, microstructure, critical caracteristics, Jc/B curves, pinning force, resistive transition, resistivity, experimental results
Petrisor T., Ciontea L., Galluzzi V., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Rizzo F., Augieri A., Armenio A.A., Sotgiu G., Mos R.B., Nasui M., Pinto V., Piperno L., Gabor M.
© Copyright 2006-2012. Использование материалов сайта возможно только с обязательной ссылкой на сайт.
Свои замечания и пожелания вы можете направлять по адресу perst@isssph.kiae.ru
Техническая поддержка Alexey, дизайн Teodor.